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NEGATIVE BIAS TEMPERATURE INSTABILIn STUDIES FOR ANALOG SOC CIRCUITS

ABDUL LATIF, MOHD AZMAN (2012) NEGATIVE BIAS TEMPERATURE INSTABILIn STUDIES FOR ANALOG SOC CIRCUITS. Masters thesis, BANDAR SRI ISKANDAR.

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Abstract

Negative Bias Tempcraturc Instability (NBTI) is onc ofthc rcccnt reliability issues in sub threshold CMOS circuits. NBTl effect on analog circuits. which reqllir~n latchcd device pairs and mismatches, will cause circuit failure. This work is (0 asscsh Ille NBTI effect considering the voltage and the temperature variations. It also pro'idcs a working knowledge of NBTI awarcness to the circuit dcsiyn co~n~nunitfoyr rclishlc design of the SOC analog circuit. There have been numerous studies to date on the NBTI affst to analog circuits. However, other researchers did not study the implication of NBTI stress on analog circuits utilizing bandgap reference circuit. Thc reliability performance of all matched pair circuits, particularly the bandgap reference. is at the mercy of aging differential. Reliability simulation is mandatory to obtain realistic risk evaluation for circuit design reliability qualification. It is applicable to all circuit aging problems covering both analog and digital. Failure rate varies as a fuction of voltage and temperature. It is shown that PMOS is the reliabilitysusceptible device and NBTI is the most vital failure mechanism for analog circuit in 8ub micrometer CMOS technology. This study provides a complete reliability simulation analysis of the on-die Thermal Sensor and the Digital Analog Converter (DAC) circuits and analyzes the effect of NBTI using reliability simulation tool. order to check out the robusmess of the NBTI-induced SOC circuit design, a burn-in experiment was conducted on the DAC circuits. The NBTI degradation observed in the reliability simulation analysis has given a clue that under a severe stress condition a massive voltage threshold mismatch of beyond the 2mV limit was recorded. experimental result on DAC proves the reliability sensitivity of NBTI to the DAC circuitry.

Item Type: Thesis (Masters)
Subject: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Users 6 not found.
Date Deposited: 30 Jul 2012 09:09
Last Modified: 25 Jan 2017 09:41
URI: http://utpedia.utp.edu.my/id/eprint/3313

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