A NOVEL AUTOMATED MODEL GENERATION ALGORITHM FOR HIGH LEVEL FAULT MODELING OF ANALOG CIRCUITS

gh level modelling techniques have been used by researchers from few decades
to increase fault simulation speed of analog circuits. However, due to manual model
generation, the techniques are tedious and time consuming and unable to reduce
analog testing time. To overcome manual modelling limitation, researchers adopt
algorithmic support and start using automated model generation (AMG) methods to
generate models for high level modelling of analog circuits. AMG models
successfully perform HLFM but unfortunately fail to increase high level fault
simulation (HLFS) speed compared to full SPICE-circuit simulations. The failure is
mainly occurred due to the consumption of multiple models and computational
overhead of model switching required capturing nonlinear effects.