Development of a Single-Chip Test and Debug Paltform using IEEE 1500 Standard

Ali, Ghazanfar (2015) Development of a Single-Chip Test and Debug Paltform using IEEE 1500 Standard. Masters thesis, Universiti Teknologi PETRONAS.

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Item Type:	Thesis (Masters)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:	Engineering > Electrical and Electronic
Depositing User:	Mr Ahmad Suhairi Mohamed Lazim
Date Deposited:	21 Sep 2023 04:06
Last Modified:	21 Sep 2023 04:06
URI:	http://utpedia.utp.edu.my/id/eprint/25080

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