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Experimental Verification Of A Diode-Clamped Resonant Gate Driver Network

Khairul Azhar bin Ishak, Khairul Azhar (2010) Experimental Verification Of A Diode-Clamped Resonant Gate Driver Network. Universiti Teknologi Petronas. (Unpublished)

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Abstract

The objective of this project is to perform analysis on the overall performance and efficiency of converter by doing experiment. The duty ratio, resonant inductor value and the dead time are the parameters that influence on the switching losses and other losses in the gate drivers. From the previous work which is done through simulation, it is found that optimized value of inductor is 9nH. By doing experiment work, to maximize capability of RGD circuit, the varied duty ratio by constructing PWM generation network, fixed inductance value of almost 9nH and varied the dead time has been chosen.

Item Type: Final Year Project
Subject: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Engineering > Electrical and Electronic
Depositing User: Users 5 not found.
Date Deposited: 03 Nov 2011 11:23
Last Modified: 25 Jan 2017 09:43
URI: http://utpedia.utp.edu.my/id/eprint/1141

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